Article 1317

Title of the article

CAUSE AND EFFECT APPROACH TO RELIABILITY MODELING 
OF "GAS PHASE – SEMICONDUCTOR" SYSTEM  

Authors

Belozertsev Aleksandr Ivanovich, first deputy general director, Scientific-research Institute of physical measurements (440026, 8/10 Volodarskogo street, Penza, Russia),  suad-olka@yandex.ru
Al-Salim Suad Zuher, doctor of physical and mathematical sciences, professor, director general, Ltd "Omega" (199048, lit. In, 19-21 embankment of the Smolenka river, Saint-Petersburg, Russia), suad-olka@yandex.ru

Index UDK

543.5;543.26

DOI

10.21685/2307-4205-2017-3-1

Abstract

The model of increase in reliability and consequently, and reliabilities of analytical measurements of vapors and gases is considered. Factors, the bound to the productive indicator expressed by mathematical dependence are investigated. For problems which are solved on the scale of real time and do not demand a  high precision of results of model operation, the determined model allowing to specify duration of an actual exposition for increase in accuracy of the quantitative calculations is constructed

Key words

model, an entropy, the determined processes, the reason, a corollary 

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Дата создания: 14.11.2017 09:17
Дата обновления: 21.11.2017 15:19